HomeFacilitiesInstrumentsVeeco Dimension 3100 Ambient AFM STM

Veeco Dimension 3100 Ambient AFM STM

20121211103612_image.jpg-thumbClark D15

Veeco Dimension 3100: Automated atomic force microscopy (AFM), magnetic force microscopy (MFM), electric force microscopy (EFM), and conductive AFM (CAFM) techniques measure surface characteristics of samples up to 200 mm in diameter. Lateral resolution <5 nm; vertical resolution <1 nm.

 

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Primary Contact

Steve Kriske
607/255-2367
sjk27@cornell.edu
Clark Hall, Room D-21
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