HomeFacilitiesInstrumentsRigaku SmartLab X-Ray Diffractometer

Rigaku SmartLab X-Ray Diffractometer

20100514143426_IMG_5505.JPG-thumbBard Hall SB56C

The Rigaku SmartLab has a new technology that allows both focusing geometry and parallel beam geometry without changing optical components. Interchangeable stages and optical components permit a large range of x-ray techniques to be performed on this instrument. New capabilities for the facility include:

  • x-ray reflectivity measurements for thin film thickness, roughness and density determinations;
  • full pole figures and phi scans for crystallographic texture analysis; high temperature XRD scans up to 1100°C in air or in vacuum;
  • high-resolution rocking curves for film and crystal quality measurements;
  • automated X-Y mapping of wafers;
  • stress measurements;
  • grazing incident angle diffraction for polycrystalline thin film.
For rates information, please see the rates page.
Primary Contact

Mark Pfeifer


Secondary Contact

Chistopher (Kit) Umbach
Thurston Hall, Room 114
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