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LEO 1550 FESEM (Keck SEM)

Clark Hall F3
Scanning electron microscope (SEM) imaging at very high resolution (1 nm at 20 keV and 2.5 nm at 5 keV) is possible with certain types of specimens. Its superb performance, particularly at low accelerating voltages (i.e., 0.5 to 3 kV), makes it especially suitable for imaging the surface detail of polymeric, biological, and other low-density materials. An in-lens secondary electron detector enables a very short working distance and responds to the lowest voltage secondary electrons. Transmission Electron Imaging TEM grids may be used in a special stage in conjunction with a detector below the specimen to obtain transmitted electron images.
For rates information, please see the rates page.
FE-SEM-Clark_06
Primary Contact

Malcolm (Mick) Thomas
607/255-0650
mt57@cornell.edu
Duffield Hall, Room 150

Secondary Contact

Philip Carubia
607/255-6757
pmc228@cornell.edu
Bard Hall, Room B-57

Tertiary Contact

Mariena Silvestry Ramos
607/255-6272
msilvestry@cornell.edu
PSB, Room B-88
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