HomeFacilitiesInstrumentsJEOL 8900 Microprobe

JEOL 8900 Microprobe

Snee Hall 1149

This is used for quantitative elemental analysis of samples on a micron scale.  Samples should be flat and are frequently polished to one micron grit or better.  Holders are available for round mounts measuring one inch, one inch and a quarter, or one inch and a half.  A special holder for unusually shaped specimens is also available.
Nonconducting specimens are normally coated with carbon using the evaporator located in 231 Duffield Hall.There are 5 wavelength dispersive X-ray spectrometers (WDS), an energy dispersive X-ray detector (EDS).  The scanning system forms images from secondary and backscattered electrons, and maps from X-rays.

For rates information, please see the rates page.

Primary Contact

Don Werder
607/255-8959
djw326@cornell.edu
Bard Hall, Room B-57
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